SJ/T 11701-2018.Common NAND flash memory interface.1范围SJ/T 11701规定了通用NAND型快闪存储器的物理接口、阵列排布、数据接口和时序以及指令定义等。...
SJ/T 11704-2018.Digital signal transmission test method for microelectronic packages.1范围SJ/T 11704规定了高频数字微电子封装中传输线的特性阻抗、传输延迟时...
SJ 51864/3-2016.Detail specification for general type multilayer chip beads.1范围SJ 51864/3规定了叠层片式通用型磁珠(以下简称磁珠)的详细要求。SJ 51864/3适用...
SJ 50065/14-2008.Detail specification for model JRW-230M，T0-5,hermetically sealed, d.c.e Iectromagnetic relays,established reliability.1范围SJ 50065/14规定了触点电流从低电...
SJ/T 10015-2013.Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values.1范围SJ/T 10015适用于频率控制和选择...
SJ 50973/44-2008.Cables，radio frequency, flexible, triaxial, type SYFPY-75-4-51， detail specification for.1范围SJ 50973/44规定了SYFPY-75-4-51型三同轴柔软射频电缆的...
SJ/T 11564.5-2017.Information technology service - Maintenance - Part 5: Specification for desktop terminal and peripheral.1范围SJT 11564的SJ/T 11564.5规定了桌面及外围设备...
SJ/T 2215-2015.Measuring methods for semiconductor photocouplers.1范围SJ/T 2215规定了半导体光电耦合器(以下简称“器件”)的测试方法。SJ/T 2215适用于半导体...
SJ/T 2938-2015.Technical requirements and test methods for signal generator of television video.1范围SJ/T 2938规定了电视图像信号发生器共有的性能特性和测试方法...
SJ/T 3172.13-2013.Ferrite cores-Dimensions-Part 13:PQ cores.1范围SJ/T 3172.13规定了用铁氧体制成的PQ磁心及低矮型PQI磁心在机械互换性方面的主要尺寸，以...
