SJ/T 11708-2018.Test methods for motor power drive module.1范围SJ/T 11708规定了功率电机驱动器(以下称为器件)的术语和定义、一般要求、测试方法等。SJ...
SJ/T 11698-2018.Method for chemical analysis of lead-free solder-The inductively coupled plasma atom emission spectrometry method.1范围SJ/T 11698规定了无铅焊锡中铜、铁、...
SJ/T 11702-2018.Semiconductor integrated circuits Measuring methods for serial peripheral interface.1范围SJ/T 11702规定了半导体集成电路串行外设接口测试方法。S...
SJ/T 11706-2018.Semiconductor integrated cireuits test methodof field programmable gate array.1范围SJ/T 11706规定了SRAM型现场可编程门阵列(Field Programmable Gate Array...
SJ/T 11712-2018.Speech recognition for smart television - Measurement method.1范围SJ/T 11712规定了智能电视语音识别系统的测试方法。SJ/T 11712适用于智能电视的...
SJ/T 11703-2018.Crosstalk test method for digital microlectronic device packages.1范围SJ/T 11703规定了在数字微电子器件封装引出端之间，测试宽带数字信号和噪...
SJ/T 11713-2018.Speech recognition for smart television - General technical requirement.1范围SJ/T 11713规定了智能电视语音识别系统的技术要求。SJ/T 11713适用于智...
SJ/T 11711-2018.Acceptance specification for indoor LED display screen multimedia system.1范围SJ/T 11711规定了室内用发光二极管(LED)显示屏(以下简称“LED显示屏...
SJ/T 11705-2018.Ground and power supply impedance test method for microelectronics device packages.1范围SJ/T 11705规定了复杂、宽频带微电子器件用封装的地和电源引...
SJ/T 10873-2018.Detail specification for electronic components Fixed metallied polyethylene- terephthalate film dielectric d.c.capacitors of CL20、CL20A Assessment levels E.1.4 规范...
