行业标准

SJ/T 11620-2016.Software Engineering-Functional Size Measurement-FiSMA1.1 method.1范围SJ/T 11620规定了FiSMA1. 1方法的定义、约定和活动。SJ/T 11620的目标人员是那...

SJ/T 11619-2016,Software engineering-Functional size measurement-NESMA method.1范围SJ/T 11619给出了NESMA功能规模测量方法。SJ/T 11619的方法原则.上适用于所有功...

SJ/T 11618-2016.Software engineering-Functional size measurement-Mk II function point analysis.1范围Mk II功能点分析方法是- -种用于对信 息处理应用程序进行量化...

SJ/T 11617-2016.Software engineering Functional size measurement COSMIC Method.1范围SJ/T 11617规定了COSMIC-功能规模测量方法的定义、约定和活动。SJ/T 11617适用于...

SJ/T 11601-2016.Information technology-General specification of non-contact type two-dimensional bar code scanner.1范围SJ/T 11601规定了非接触式二维码扫描枪(以下统称...

SJ/T 11461.5.2-2016.Organic light emitting diode (OLED) displays-Part 5-2: Mechanical endurance testing methods.1范围SJ/T 11461的SJ/T 11461.5.2规定了评价有机发光二极管...

SJ/T 11461.6.2-2016.Organic light emitting diode (OLED) displays Part 6-2: Measuring methods-Visual quality.1范围SJ/T 11461.6.2规定了有机发光二极管(OLED) 显示模块和显...

SJ/T 2658.15-2016.Measuring method for semiconductor infrared-emitting diode-Part 15: Thermal resistance.1范围SJ/T 2658.15规定了半导体红外发射二极管(以下简称器件...

SJ/T 2658.14-2016.Measuring method for semiconductor infrared-emitting diode-Part 14: Junction temperature.1范围SJ/T 2658.14规定了半导体红外发射二极管(以下简称器件...

SJ/T 2658.16-2016.Measuring method for semiconductor infrared-emitting diode-Part 16: Photo-electric conversion efficiency.1范围SJ/T 2658.16规定了半导体红外发射二极管...