SJ/T 11478-2014.IP core quality evaluation.1范围SJ/T 11478规定的是对IP核质量的主要方面，包括IP核的文档质量、IP核的设计质量、IP核的模型质量、IP核...
SJ/T 11479-2014.IP documentation guide.1范围SJ/T 11479规定了数字IP核相关文档结构方面的内容，包括IP核简介、功能规范、设计手册、功能及物理验证...
SJ/T 11488-2015.Test method for measuring resistivity, hall coefficient and determining hall mobility in semi-insulating GaAs single crystals.1范围SJ/T 11488规定了半绝缘砷化...
SJ/T 11489-2015.Test method for measuring etch pit density(EPD) in low dislocation density indium phosphide wafers.1范围SJ/T 11489规定了低位错密度磷化铟(InP) 抛光片腐...
SJ/T 11490-2015.Test method for measuring etch pit density(EPD) in low dislocation density gallium arsenide wafers.1范围SJ/T 11490规定了低位错密度砷化镓(GaAs)抛光片腐...
SJ/T 11516-2015.Specification for thin film transistor(TFT) mask.1范围SJ/T 11516规定了薄膜晶体管(TFT) 用掩模版产品的技术要求、试验方法、检验规则以及包...
SJ/T 11530-2015.Information technology-General specification for switching power adapter.1范围SJ/T 11530规定了开关型电源适配器(简称电源适配器)的术语和定义、...
SJ/T 11532.1-2015.General technical requirements of electronic label for dangerous chemical gas cylinder identification-Part 1: Gas cylinder electronic identification code.1范围SJ...
SJ/T 11532.2-2015.General technical requiments of eletronic label for dangerous chemical gas cylinder identification-Part 2: Application technical specification,1范围SJ/T 11532的...
SJ/T 11532.3-2015.General specification of electronic label for dangerous chemical gas cylinder identification-Part 3: Special requirements for reader/writer.1范围SJ/T 11532的SJ/...
